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European Congress of Chemical Engineering - 6
Copenhagen 16-21 September 2007

Abstract 2692 - Application of tBTEM and other multivariate techniques to quantitative in-situ UV-Vis measurements

Application of tBTEM and other multivariate techniques to quantitative in-situ UV-Vis measurements

Systematic methods and tools for managing the complexity

Process Analytical Technology - PAT (T4-6)

Dr Feng Gao
Institute of Chemical and Engineering Sciences
Process Science & Modelling
1 Pesek Road, Jurong Island,
Singapore,627833
Singapore

Mr Huajun Zhang
Institute of Chemical and Engineering Sciences
Applied Catalysis
1 Pesek Road, Jurong Island, Singapore 627833
Singapore

Dr Liangfeng Guo
Institute of Chemical and Engineering Sciences
Process Science & Modelling
1 Pesek Road, Jurong Island, Singapore 627833
Singapore

Dr Marc Garland
Institute of Chemical and Engineering Sciences
Process Science & Modelling
1 Pesek Road, Jurong Island, Singapore 627833
Singapore

Keywords: In-situ UV-Vis spectroscopy; Multiple perturbations; tBTEM;

One recently proposed self-modeling curve resolution algorithm, two-band targeting entropy minimization (tBTEM), was applied to UV-Vis spectral analysis, to blind recovery of pure spectra and to calculate the concentrations from their linear mixtures. 9 spectra were collected in one semi-batch experiment with multiple perturbations of three highly-overlapping dyes, namely, bromophenol blue sodium salt, bromocresol green sodium salt and methyl orange. Good estimated pure spectra, compared to experimental references, were recovered without any a priori information. This result demonstrated that tBTEM can be successfully used to reconstruct the pure component spectra from broad and highly overlapping spectral data.
This work complements and extends previous work on the deconvolutions of FTIR [1], Raman [2] and MS [3] data based on an information entropy minimization concepts.


[1] E. Widjaja, C.Z. Li, M. Garland, Organometallics 21(9) (2002) 1991; C.Z. Li, E. Widjaja, W. Chew, M. Garland, Angew. Chem. Int. Ed. 41(20) (2002) 3786.
[2] L. R. Ong, E. Widjaja, R. Stanforth, M. Garland. J. Raman Spectrosc. 34 (4) (2003) 282.
[3] H.J. Zhang, M. Garland, Y.Z. Zeng, P. Wu, J. Am. Soc. Mass Spectrom. 14 (11) (2003) 1295.

Presented Wednesday 19, 11:40 to 12:00, in session Process Analytical Technology - PAT (T4-6).

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