Special Sessions

Industry-Sponsored Sessions

Session 1

Abstract: Engineers from all disciplines can benefit from cross-disciplinary expertise. We see biomedical engineers working on complex mechatronic systems along-side mechanical and electrical engineers. Find out how educators can captivate engineering students through hands-on instructional labs while preparing them to solve industry-relevant problems. Learn how Quanser is helping educators share resources to create a truly collaborative learning environment.

Session 2

Abstract: National Instruments has introduced a number of high-level development frameworks, commonly referred to as “models of computation,” into a unified graphical system design platform.  Examples include text-based math, C code, UML compatible statecharts, signal flow, and event-driven user interfaces (Event structure).  This software can also be used to target multicore processors, off-the-shelf real-time and FPGA-based systems as well as custom microprocessor and microcontroller devices.  This presentation will include live demonstrations of real-time control system deployment to embedded targets including the NI CompactRIO system used for the next-generation FIRST Robotics Competition (FRC) robot controller.

Session 3

Abstract: The field of control has a long and distinguished history of achievements on intellectual and practical fronts.  Prospects for the future of control are bright too, provided we can direct our skills and energies appropriately. Some traditionally strong application areas have become commoditized, but others provide new terrain where our expertise can help make a mark. Gaining recognition outside our core community has also been a constant challenge for control scientists and engineers.  Whether it is because control is a “hidden technology” or because we are not good enough at marketing ourselves and our field (or, more likely, both), many of our contributions go unheralded.

This session, co-sponsored by the IEEE CSS Task Force on Outreach, will discuss issues related to the outreach and impact of control.  Past successes, the current state, and future prospects will be covered.  Panelists will be asked to give brief remarks at the beginning of the session and we will engage the audience in an open discussion for the remaining time.  This session will help provide input and direction to other activities (e.g., workshops) that are being planned to drive the “outreach and impact of controls” agenda forward. We anticipate a stimulating and provocative session and we invite all ACC attendees to observe and contribute. Box lunches will be provided (quantities are not unlimited, so come early!)

Session 4

Abstract: Process Analytical Technologies (PAT), in particular Principal Component Analysis (PCA) for fault detection and Projection to Latent Structures (PLS) for end of batch quality prediction, are seen as pivotal techniques for improving process operation. A number of software packages are available today for off-line analysis. The difficulty for control or production engineers is that these tools are not designed for on-line operation. Many PAT issues may be addressed by tightly integrating analytic tools with the production and control system. This special session examines basic design requirements associated with batch analytics applied for on-line operation. The presentation delivers an in-depth look at the data processing requirements, calculations and limitations for the application of on-line analytics to a batch process. It will show how to achieve proper data alignment for different batches, a key requirement for building good statistical models, and how to use the model for on-line analysis.  A typical batch operation in the chemical industry and a running simulation will be used to illustrate the advantages of on-line process analytics over traditional monitoring and control techniques.  Details will be presented on the approach taken to integrate analytic tools and results into a commercial control system with examples of control and production operation screens.

Sessions On Emerging Topics

Session 1

Abstract: This special session describes emerging modeling and control problems and solutions for integrated systems that operate at the micro and nano length scales. Complete integrated systems can be as small as millimeters across, which can include dozens of individual components with sizes ranging from nanometers to 100s of microns. These integrated systems typically incorporate such elements as microelectronics, photonics, micro-cantilevers, and microfluidics. These small-scale systems are typically manufactured by using techniques for integrated circuits and/or polymer-based techniques such as micro-injection molding and micro-imprinting. Models and control designs for these systems typically have to be adjusted to account for or utilize the characteristics of small length scales. The special session will have three presentations that describe a variety of micro and nanosystems and their associated modeling and control problems.

Session 2

Abstract: Control of experiment is essential part of Atomic Force Microscopy (AFM). AFM is the technique in which is a minute probe is applied for high-resolution profiling of samples and studies of their mechanical and electric properties at the nanometer scale. The importance of this technique is increasing with miniaturization of functional industrial components and related need in comprehensive material characterization at small dimensions.  In recent years control systems community expressed significant interest to AFM (several invited sessions at ACC 2008 and ACC 2009, publications in Control Systems Magazine).  Further development of this method, which is related to transition to multi-frequency and broad band measurements and use increasing number of lock-in amplified, is inconceivable with proper advances in design and control of AFM instrumentation and applications. With increasing role of nanotechnology, AFM becomes an important tool in control education and research. However, few control experts have access to expensive AFM instrumentation. AFM Simulator allows control experts to demonstrate applicability of their theories and algorithms to AFM. This will increase the needed flow of ideas from control community to AFM instrument designers and practitioners. Simulator can be also introduced into control curriculums to expand them towards nanotechnology applications.All this shows the importance of this special session that will attract the control scientists and specialists to this valuable practical field.

Session 3

Abstract: The goal of this special session is to describe emerging approaches and research opportunities for control engineering in a developing research topic of important societal significance.  Specifically, we explore how control systems and related approaches from systems science can be applied to the prevention and treatment of chronic behavioral disorders; these include drug and alcohol abuse, depression, HIV/AIDS, cancer, diabetes, obesity, cardiovascular health, and aging.  Effective management of chronic behavioral disorders has major impact on public health, requiring hierarchical, multi-stage decision-making of prevention and treatment components over time.  Conceptually, such time-varying interventions represent forms of closed-loop control systems where intervention dosages (i.e., manipulated variables) are determined by decision rules (i.e., controllers) based on the values of a participant’s key characteristics (i.e., tailoring variables or controlled variables).  Consequently, drawing from control engineering has the potential to significantly inform the analysis, design, and implementation of novel behavioral interventions, leading to improved adherence, better management of limited resources, a reduction of negative effects, and overall more effective interventions. Advances in this field involve significant modeling and computational challenges that need to be addressed.  Novel decision rules will draw not only from control engineering, but also from the fields of artificial intelligence, statistics, and computer science.  Practical solutions will involve individuals from diverse disciplines (e.g., psychologists, physicians, statisticians, computer scientists, applied mathematicians, and engineers). The session brings together a control engineer (Rivera), a quantitative psychologist (Collins), a statistician (Murphy) and a computer scientist (Pineau) with relevant program officers from NSF (Chowdhury) and NIH (Mabry) to address challenges and opportunities in this field.